Laser Test Stand Operation
==============================================================================
TEST/PROTO.04 JAN 12, 2000
'PROTO' - Laser scan software for silicon microstrip detectors
==============================================================================
0.0 Table of Contents
0. Table of Contents
1. Test Overview
2. Safety Precautions and Materials List
3. Test Preparation
4.0 Depletion Voltage Measurement and Laser Scan
4.1 Stage Calibration
4.2 Depletion Voltage and I-V Curve Measurement
4.3 Laser Scan
5 ADC Output Sampling and "Cal-Inject" Test
6 Instructions for Creating a Test Report
1.0 Test Overview
1.1 The laser test station and the PROTO test software are designed to
perform the following tests for the silicon microstrip detectors
1.1.1 Laser scan test
1.1.2 Detector ADC output sampling in Data mode
1.1.3 Detector ADC output sampling in Cal-inject mode
1.1.4 Short electrical test (using 1.1.3).
2.0 Safety Precautions and Materials List
2.1 Safety Precautions
2.1.1 Refer to the FERMILAB Safety Guide and federal, state, and local
government regulations.
2.2 Classified.
2.3 Materials List
2.3.1 A SaSeq board
2.3.2 A Greenboard
2.4.1 An HDI to test, by itself or bonded with sensor(s).
2.3.4 A Bit 3 crate
2.3.5 An x86 PC with Bit3 Interface card
2.3.6 "Proto" software
2.3.7 Tektronix PS2521G three-output DC voltage supply
2.3.7 Model 617 multi-source programmable voltage supply.
3.0 Test Preparation
3.1.1 Bias the detector sensor with Model 617 multi-source voltage supply
appropriately for the type of the detector being tested. Consult
your shift captain regarding the specifics.
3.1.1 Connect the Hiroshi strip terminal from the HDI to either chain A or
chain B socket on the Greenboard.
3.1.2 Supply the power the HDI by turning on the Tektronix PS2521G
triple output power supply. The power must be turned on in the
following sequence to prevent latch up of HDI circuits and possible
damage to the HDI: Memory 1, Memory 2, and Memory 3.
3.1.3 Turn on the VME board power and the fan below it.
3.1.4 On the interfaced PC, start the "PROTO" program. It can be started
by double clicking its icon or by directly invoking its full path,
usually "C:\Program Files\Proto\Proto.exe".
3.1.5 In the Proto window, choose Bit3 folder from the upper binder.
Reset the Bit3 controller by clicking on "Reset Bit 3" button.
Warning: Resetting Bit3 will destroy robot calibration. Make
sure that the "Reset Status" light turns into green when done.
If it turns red, verify that the VME board is turned on.
3.1.6 In the Proto window, choose SaSEQ/Chips folder from the upper binder.
Choose ScanView from the lower binder.
3.1.7 In the SaSEQ/Chips folder, choose the appropriate HDI type under the
"SaSEQ" listbox. To change SaSEQ configuration, click on the Setup
button above the listbox.
3.1.8 Choose the chain to which the SVX chips to test are connected in the
"Chain" list box.
3.1.9 If it is required to download a different set of parameters to the
chips than the one provided by default, select the chip in the "Chip"
list box and select the parameters to change in the parameters list
box below. Then the program will prompt for a different value for
the parameter. It automatically checks for the upper and lower
bounds of each parameters. The bounds are listed in the parameters
list box.
3.1.10 Click on the "Download Chain" button to initialize the SaSEQ and to
download the chip parameters to the chips in the selected chain.
The "Error Light" should turn green after a successful download.
If it turns red, verify that the correct SaSEQ parameters and HDI
types are selected. Also verify that the connection of the HDI to
the Green board is secure.
3.1.11 The "Scan View" window should now display a live graph of the data
outputs from all chips connected to the selected SaSEQ board.
Notice the setpoint and actual reads per second in the Scan View
Setup window frame.
4.0 Depletion Voltage Measurement and Laser Scan
4.1 Stage Calibration
4.1.1 At the home position of the stage, the laser lens is placed well in
front of the of the edge of the sensor away from the HDI and well in
left of the left sensor edge. If parts of the stage arm is likely to
encounter obstacles on its course to the home position, then clear
the HDI and the green board and other removable items from the stage
platform, home the stage, and then set-up the removed items again.
Be sure to turn off and on the power in the proper sequence when
removing and restoring the items.
4.1.2 Place the detector on the testing pad such that the metal heat sink
pad on bottom of the HDI carrier is securely leaning against the
right and front posts on the testing pad.
4.1.3 Choose the correct ladder type and the chain in the SaSEQ/Chips
folder. Click on "Download Chain" to download SVX chip parameters
and to initialize SaSEQ.
4.1.4 Go to "Barrido Automαtica Del Laser" folder and click on the
"Teach Robot / Scan" button. "Barrido..." stands for "Automatic
Laser Sweep".
4.1.5 In the Laser Scan control window, click on the Bit3 Init button
to initialize the Bit 3 controller if it has not previously been
initialized.
4.1.6 Click on the "Stage" button in the "Initialization" frame to reset
and home the stage. Watch where the stage is moving. To stop the
movement anytime, push the big yellow "Stop" button. If it doesn't
work, click the big red "Emergency Abort" button. If that doesn't
work either, turn off the VME crate. As a last resort, switch the
stage power switch off.
4.1.7 Click on the "SaSEQ" button in the "Initialization" frame to
initialize SaSEQ and to download configuration parameters to each
chip in the selected chain if it was not done previously.
4.1.8 Click on the "Bias" button in the "Initialization" frame to reset
the bias voltage pods. This will also turn off the pods. In the
"Bias" frame, select the appropriate supply source for the ladder
(usually #7), click on the "On/Set" button, and enter the desired
bias voltage. The bias can be turned off by resetting the bias
voltage pods again. For stage calibration purposes, higher of the
30V or the depletion voltage plus 15V is appropriate.
4.1.9 Turn on the laser. Make sure that the "Delay" knob is set to
50ns.
4.1.10 Click on "Find Best Area" button. The system will move the laser
away from the sensor and take time average of each channels.
It will then find two cleanest sensor regions for use in stage
calibration.
4.1.11 Click on the "Calibrate" button. The laser will move to four
locations in the sensor to determine 1) the spacing between each
strip, 2) the coordinate of the left corner on the sensor away
from the HDI, and 3) tilt of the sensor relative to the stage.
4.1.12 Observe the shape of the laser beam profile in the "Scan"
graph window. If the signal appears to be too weak or too
strong (saturating), press the "STOP" button when the laser
beam is still visible in the Scan graph and adjust the
luminosity of the laser. Then re-do the calibration. Do not
use the "Delay" knob to adjust the luminosity. Leave it at 50ns.
4.2 Depletion Voltage and I-V Curve Measurement
4.2.1 Determine the voltage scan range for the depletion voltage and
I-V curve measurement as follows using previously measured
parameters in the traveler.
Previously measured parameters:
VdTS - Depletion voltage previously measured with C-V curve.
VmMax - Maximum allowable P-side bias for double-sided
detectors.
4.2.1.1 3-Chip and H-Disk:
Positive source scan range: 0V to greater of 50V or
VdTS+20V but less than 90V.
4.2.1.2 6-Chip, 9-Chip, and F-Disk: These needs to be split-biased as
follows:
Negative source: Fix it to the higher of (in absolute value)
VmMax or (VdTS+20)/2.
Positive source scan range:: 0V to VdTS+20 minus
(the absolute value of) the Negative source voltage
but less than 90V.
4.2.2 Click on the "Parametros del Barrido" button in the "Barrido
Automαtica Del Laser" folder.
4.2.3 Type in the range for the voltage scan as determined from above
in the "Voltage Scan Range" fields.
4.2.3 Click on "OK" button to close the window.
4.2.4 In the "Laser Scan" window, click on the desired region on the
detector to measure the I-V and depletion voltage in the
"Depletion Voltage Scan" box, and type in the strip number
at which to center the laser spot. By default, the software
integrates output from 60 strips around the center strip.
It is best to choose a region in the detector free of the
noisy channels. The detector region is determined as follows:
3-Chip 6-Chip 9-Chip
Active Front Active Chips 0-2 Active, Chips 0-5
Active Back N/A N/A Active, Chips 6-8
Passive Front Passive Chips 3-5 Passive, Chips 0-5
Passive Back N/A N/A Passive, Chips 6-8
H-Disk F-Disk (8-Chip) F-Disk (6-Chip)
Active Front Active Chips 0-7 Chips 0-5
Active Back N/A N/A N/A
Passive Front Passive
Passive Back N/A N/A N/A
4.2.5 Make sure that the bias supply source in the Laser Scan
window is set to the positive bias source (usu. #7).
It is this source that the voltage will be stepped.
(It is not recommended to do the scan with the negative
voltage source without supervision of the shift-captain,
as the P-side of the detector can draw huge amount of
currents through the microdischarge effect)
Press "Scan Vd" to start the test.
4.2.6 During the test, if the system cannot reach a set-point
voltage, increase the voltage tolerance by (usu. from 3V
to 3.5V or 4V) in the Automatic Laser Scan Setup window
by clicking on the "Parametros de Barrido". Then press
OK.
4.2.7 To stop the voltage scan before it completes, or if the
scan stalls for the reasons other than tight voltage
tolerance, press the ">> STOP <<" button.
4.2.8 When the test is completed, a pop-up window appears with
the results of the scan. The results can be copied to the
clipboard and be used for further analysis. A section
below explains how to use Ron Lipton's Excel analysis
program to process the results.
4.2.9 Instructions for Reading the Voltage Scan Results
N - Number of data samples taken per voltage step.
VdSetPt- Setpoint voltage
VdAvg - Average value of the actual (monitored) voltage
VdStdev - 1 sigma spread in the monitored voltage
IdAvg - Average value of the monitored current
IdStdev - 1 sigma spread in the monitored voltage
AreaAvg - Average integrated sum of the ADC output
around the scanned strip. By default,
30 channels left and right of it are summed.
When the area reaches saturation, the charge
collection efficiency is at maximum.
AreaStdev - 1 sigma spread in the ADC integrated sum.
4.2.10 For a good detector, the current should stay below 30ľA in
the entire scanned voltage range. If the current is above
50ľA, then a broken capacitor is suspected and the device
should be subject to inspection by a debugging personnel.
4.3 Laser Scan
4.3.0 Find the Operating voltage for the detector by performing
the depletion voltage scan (per 4.2 and 6.2) if it is not
known already.
4.3.1 Set the sensor bias as follows (cf. 4.2.1 and 4.2.9).
3-Chip and H-Disk: Positive Bias: Operating voltage
6-Chip, 9-Chip, and F-Disk: These needs to be split-biased as
follows:
Negative source: Fix it to the higher of (in absolute value)
VmMax or (VdTS+20)/2.
Positive source scan range:: 0V to Operating Voltage minus
(the absolute value of) the Negative source voltage
but less than 90V.
4.3.2 Scan across the sensor by pressing "Scan Active" or "Scan Passive"
button. The stage steps across each strip, and takes a default of
10 events per strip.
4.3.3 During any point of the calibration or the laser scan, the stage
can be stopped by pressing the "STOP" button. Pressing the
"Emergency Abort" button will force abort of the stage movement
and turn off the bias voltage as well.
4.3.4 Observe the placement of the laser peak at the starting strip.
The peak of the laser should land on the first strip to be scanned.
4.3.5 After completion of the scan, view the results in the "Scan Results"
list box. The results can be copied to the Clipboard for further
processing (e.g. using Ron's data analysis software, explained in
a later section) by clicking on the "Copy To Clipboard" button in
the "Barrido Automαtica Del Laser" folder.
4.3.6 Instructions for Reading the Laser Scan Results
4.3.6.1 All values are baseline-suppressed.
4.3.6.2 Strip- Sensor strip number that begins from 0.
4.3.6.3 Chip - Index to the SVX chip to which the strip belongs to.
4.3.6.4 Channel - SVX channel to which the strip is connected to. This
number begins from 0.
4.3.6.5 Avg - Average value of the strip output when laser was shined directly
above it. By default, a scan takes 10 events per strip.
4.3.6.6 Avg Pass/Fail - "Failed" if the average output is outside a pre-set
bound. The bounds are set to sort out the dead, weak or overly
sensitive strips.
4.3.6.7 Stdev - Standard deviation of the scanned data.
4.3.6.8 Stdev Pass/Fail - "Failed" if the standard deviation of the output
from the channel is outside an upper limit. It is useful for
determining noisy channels.
4.3.6.9 N Sigma - The number of standard deviations the average output for a
strip is away from the strips in the sensor ranking from 25% to 75%
in magnitude. The top and bottom 25% of the data are thrown away to
avoid contamination of the data pool from non-representative strips.
A strip with high N Sigma had responded very differently during the
scan than the rest of the strips in the sensor. The mean and stdev
thus determined is referred to as the "natural excited response" of
the sensor.
4.3.6.10 N Sigma Pass/Fail - "Failed" if the output from the strip is
away from the natural sensor mean by greater of 4 natural sigmas
or 5 counts by default.
5.0 ADC Baseline Output Sampling and "Cal-Inject" Tests
5.1 These tests can be done without the aid of the stage movement unit
(i.e. without stage calibration). Be sure to turn the laser off
when performing these tests.
5.2 Click on the "Setup" button next to the "SaSeq" listbox to
open the "SaSEQ Parameter Setup" window.
5.3. Set the acquisition mode for the detector to either "Data" mode
for Baseline output sampling or to "Cal-Inject" mode for
"Cal-Inject" test.
5.4 Click on the "Commit Setpoint" button.
5.5 If "Cal-Inject" mode is selected, set the "CalVolt" parameter
appropriately to prevent signal saturation. Typical range for
testing n-side is &HE0 to &HFF. For p-side, &H00 to &H20.
Click on the "Commit Setpoint" to commit the setting and
observe the resulting signal.
5.6 Press the "Close" button in the "SaSEQ Parameter Setup" window.
5.7 Set the bias for the sensor (if necessary) by using the bias
board controls in the "Laser Scan" window invoked by pressing
"Teach Robot/Scan" button in the "Barrido Automatica Del Laser"
folder.
5.8 Reset the event statistics counter by clicking "Reset Baseline Stat"
button in the "Baseline Results" folder. The number of accumulated
events are shown in the "Total Reads" text box in the "SaSEQ/Chips"
folder.
5.9 Choose whether to suppress the offset or not by clicking on
"Suppress Offset" button in the "Scan View Setup" box.
Typically, the offset is chosen not to be suppressed. This
choice can be made anytime during the sampling, as the system
keeps track of both offset-suppressed and offset-included
statistics internally.
5.10 When enough events have been accumulated, go to "Baseline Results"
and click on "Update" button. The event statistics listbox should
now be filled with the statistics. Clicking "Update" does not
reset the event statistics, so you can keep clicking "Update"
to see progressively cumulative statistics.
5.11 The data can be exported to Clipboard for further analysis (i.e.
using Ron's data analysis software, cf. 6.0) by clicking on the
"Copy to Data to Clipboard" button in the "Baseline Results"
folder.
5.12 Instructions for Reading the Baseline Statistics Results
5.12.1 Strip- Sensor strip number that begins from 0.
5.12.2 Chip - Index to the SVX chip to which the strip belongs to.
5.12.3 Channel - SVX channel to which the strip is connected to. This
number begins from 0.
5.12.4 In each event read cycle, the program determines the natural mean and
standard deviation of the data set consisting of first 40 strips whose
readouts are closest to the median readout in each chip. The values
are then taken as the natural event statistics for the chip, as all
outliers would be excluded in the process.
5.12.5 Data - Value of the last read data for the strip.
5.12.6 Sigma - Sigma level on which the last read data stands. It is
obtained by dividing by the natural standard deviation of chip (to
which to strip belongs) the difference between the last read
data and the natural mean. Higher the Sigma, the more unusual the
strip among all other strips in the chip.
5.12.7 Mean - Mean of the accumulated events for the strip.
5.12.8 Stdev - Standard deviation of the accumulated events for the strip.
5.12.9 #oocL - Out of control low - Number of events falling below a
sigma level limit for the chip that the strip belongs to. The sigma
level limit is set to the higher of four or the number 5.
(i. e. limit for Value-Mean is the Lager of 4*Sigma or 5).
See 5.12.6 for an explanation of the sigma level.
5.12.10 #oocH - Out of control low - Number of events falling above a
sigma level for the chip that the strip belongs to. See 5.12.8.
5.12.11 % failure - Percent of the accumulated events the strip gave an
output above or below the sigma level limit.
(i. e. (#oocL+#oocH)/(total events) in percent)
5.12.12 Classification - The strip is classified as a "Failed" strip if
the % failure exceeds a certain limit, set to 5% by default.
6.0 Instructions for Creating a Test Report
6.1 Report Setup and Overview.
6.1.1 In the Windows Shell background window, open Ron Lipton's
"Laser_Analysis.XLS" excel analysis file.
6.1.2 Activate the "Main" sheet.
6.1.3 Click on "List failed channels and Save Files".
In the dialog that appears, enter the full Ladder ID, test
date (in m/d/y format), maximum negative bias voltage (if
known and applicable) and your name. Also select the ladder
type. Then click on "Done" button.
6.1.4 The following data are to be included in the full report:
a. Depletion voltage and IV curve scan
b. Laser scan results
c. Cal-inject (optional or if requested by shift captain)
d. Baseline (optional or if requested by shift captain)
6.1.5 When the last piece of data is entered into the report,
save the data on the disk by clicking on "List failed channels
and Save Files" button in the "Main" sheet. A second copy of
the report will be saved in "\\D0SERVER4\PROJECTS\SIDET\LASERTEST"
remote folder.
6.1.6 The definition of Active and Passive region of the detector
is as follows for each detector type when creating this report:
3-Chip 6-Chip 9-Chip
Active Front Active Chips 0-2 Active, Chips 0-5
Active Back N/A N/A Active, Chips 6-8
Passive Front Passive Chips 3-5 Passive, Chips 0-5
Passive Back N/A N/A Passive, Chips 6-8
H-Disk F-Disk (14-Chips)
Active Front Active 8-chip side
Active Back N/A N/A
Passive Front Passive 6-chip side
Passive Back N/A N/A
6.2 Creating Depletion Voltage and IV Scan Report
6.2.1 When an IV scan is done to create I-V curve and to measure
the depletion voltage scan, copy the data to the clipboard.
(per 4.2.8)
6.2.2 Paste the data on the cell "A1" of the appropriate sheet in the
analysis spreadsheet, as shown below:
Active region - Paste data to "VdActiveFront" sheet.
View the chart in the "VdActiveFrontChart" chart.
Passive region - Paste data to "VdPassiveFront" sheet.
View the chart in the "VdPassiveFrontChart" chart.
P-side IV curve - Paste data to "PSideIV" sheet.
View the chart in the "PSideIV" chart.
6.2.4 View and print the IV curve and depletion voltage scan chart by
activating the chart sheet and activating "Print" command under
"File" menu.
6.2.5 To determine Vd, draw a best-fit line fitting the
Area-Voltage curve from the lowest scanned voltage (usu. 0V).
Only include the linear region and exclude the region where
the slope bends appreciably. Then draw another best
fit line along the region where Area-Voltage curve saturates.
Intercept of the two lines gives the Vd as measured by the
laser scan. Make sure to add the negative bias voltage to
the result to get the correct Vd for double-sided sensors.
6.2.6 To determine the Operating Voltage, find a reasonably
saturated region in the Area-Voltage curve within
Vd+10 to 25V, with the absolute maximum of 90V.
Make sure to add the negative bias voltage to the result
to get the correct Operating Voltage for the double-sided
sensors. This voltage is to be used in the laser scan.
6.3 Creating a Laser Scan Report
6.3.1 When each scan is finished (Passive or Active) for the detector,
copy the data to the clipboard (per 4.3.5).
6.3.2 Activate either "Passive" or "Active" sheet in the analysis
spreadsheet. Select cell "A1". Then click on "Paste" command
under "Edit" menu to paste the data.
6.3.3 View the graph by clicking on "ActiveChart" for the active region
chart, or "PassiveChart" for the passive region chart.
6.3.4 Print the charts by invoking on "Print" command in "File" menu.
6.3.5 Click on "List failed channels and Save Files" in the "Main" sheet
to list the dead channels, which are the channels that gives ADC
output of less than 40 above the pedestal when shined to by the
laser.
6.3.6 Print the list by invoking on "Print" command in "File" menu.
6.3.7 Instructions for Reading the Scan Chart
6.3.5.1 Each graph shows the average and the standard deviation of the
pedestal-suppressed response of the each channel when the laser
was shined on top of it. The scan program takes a default of 10
measurements per strip.
6.3.5.2 A dead channel does not respond to the laser, so its pedestal-
suppressed response will be close to the zero
6.3.5.3 Also note the channels that responds to the laser weaker or stronger
than their peers. Those channels that doesn't fit into distribution
tend to lie in a contiguous region, and tend to have high standard
deviation in the response as well. They represent defects within the
sensor.
6.4 Creating a Cal-inject and Baseline Readout Report
6.4.1 Copy the data to the clipboard after a cal-inject or a baseline
readout is done (per 5.0).
6.4.2 Paste the cal-inject data to the cell "A1" of "Cal-Inject" sheet, and
baseline readout data to the cell "A1" of the "Baseline" sheet.
6.4.3 View the graphical output in "Cal-Inject Chart" and "BaselineChart"
chart sheets. Print them.
6.5 Archiving the Report
6.5.1 Insert the printed Vd/IV charts, laser scan charts, and dead-channel
list in the detector traveler.
6.5.2 Fill out the laser scan test report in the detector traveler.
6.5.3 Fill out the laser scan test report in the electronic database
in "http://martureo.fnal.gov/d0smtproduction/database/database.asp"
page.
6.5.4 At the end of the shift, review the finished scan reports with the
shift captain for detector disposition.
7.0 Software Parameter Configuration
7.0.1 All parameters for configuring the software is set in the "Automatic
Laser Scan Setup" window. The window is invoked by pressing
"Parαmetros Del Barrido" button in the "Barrido Automαtica Del Laser"
folder.
7.1 Short Electrical Test Parameters
7.1.1 The parameters for short electrical test are in "SPC for Baseline
Output Noise" frame window.
7.1.2 The Negative and Positive delta limit sets a cut (in multiples of
natural chip sigma) for the output from each channel. The minimum value
for such cut in either positive or negative direction from the natural
mean is set the in the Minimum Positive or Negative Delta.
7.1.3 "Failure Tolerance" - The maximum percent of the time a strip can
give the output outside the cuts without being labeled as failed.
7.1.4 "Minimum Data Set" - Baseline Results will not be computed unless a
minimum of this number of events have been processed.
7.2 Laser Scan Test Parameters
7.2.1 The parameters for the laser scan test are in the "Configuration at
Scan" frame window.
7.2.3 Channel Output Specs - Acceptable ranges for the average and the
standard deviation of the collected samples during the scan.
7.2.4 SPC Specs - Maximum allowed deviations for an averaged strip output
to be from the natural mean of the sensor. This limit is larger of
a constant or a multiple of the natural sensor standard deviation.
7.2.1 Samples Per Scan - Number of events to take when the laser is shined
on the strip. Laser will move to the next strip after that.
7.2.2 Max Scan Retries - Maximum number of attempts to retake the samples
when either there is an I/O error or when the scan result for the
channel is outside the specification. All good reads prior to the
retry for the strip is discarded, and the events are taken anew.
7.3 Other Notes
7.3.1 The program powers and enables both chains at the same time by default.
To enable only one chain, set the IGNORE register in SaSEQ parameter
setup dialog box as follows and press "Commit" button.
Chain A only: &H20
Chain B only: &H10
Both chains (default): &H0
7.3.2 The program sends the following sequence of commands to the SaSEQ
TRIGGER register to acquire the signal:
&H00: ;Set acquire mode with 132ns crossing time
&H02 &H02 &H02 ;Sample with 132ns crossing time
(Performs a sequential read)
&HA8 ;Initialize
CSR to &HA6 ;Reset SaSEQ board
==============================================================================
Revision History
==============================================================================
Ver | Date | Name | Reason
----+--------------+--------------------+-------------------------------------
001 Oct 04, 1999 John Rha New Document
002 Nov 03, 1999 John Rha Section 4.1- Document update for the
scan software release 1.6.
1. Added instructions for improved
stage calibration algorithm.
2. Added sensor bias control
instructions.
3. Added data export facility to
Ron Lipton's laser test report
generator Excel spreadsheet.
003 Nov 12, 1999 John Rha Section 4.1-
1. Required to home the stage
before removing the detector
from the laser test station.
2. Required to adjust laser
luminosity to avoid weak signal
or signal saturation.
004 Jan 12, 1999 John Rha Section 4 -
1. Added procedures for IV-curve
generation and depletion
voltage scan.
2. Added detector biasing
instructions.
Section 5 -
1. Added cal-inject instruction.
Section 6 -
1. Updated test report generation
instruction to accomodate an
enhanced version of the Ron's
report generator spreadsheet.
==============================================================================