Tests using stand alone sequencer setups

 

Functional tests

 

Purpose

Input

Information to look at

Output

1

Test "read all" mode

One standard download file with all channels "off" (pedestal)

  1. chip ID’s;
  2. channel numbers;
  3. pedestal is nonzero
  1. text file
  2. download file for "read neighbour" mode

 

2

Test "read neighbour" mode

Download file created in test 1 (inject 3 MIPs in every 8th channel, set threshold = mean_ped + 3 )

Channel numbers

OK if readout channel numbers coincide with the mask

Not OK otherwise

3

Test gain (full scale)

Run one cycle of burn-in test

  1. pedestal vs channel
  2. gain vs channel
  3. compare list of bad channels with plots
  4. look at gain vs charge
  1. text file: pedestal for each channel; gain for each channel; mean pedestal, mean gain, slope of pedestal within chip; list of noisy and dead channels
  2. plots

4

Test gain (low charge)

Run one cycle of burn-in test with injected charge around 1 MIP

  1. pedestal vs channel
  2. gain vs channel
  3. compare list of bad channels with plots
  4. look at gain vs charge
  1. text file
  2. plots

 

 

 

 

 

Software pieces:

 

Excel spreadsheet with Visual Basic routines

 

low level readout software

 

raw data to ntuple (modified newdaq)

 

analysis routines

 

GUI interface