Module Testing

6/16/2003 Electrical Stave Status (A.Nomerotski)
Andrei's talk on Module Testing at Sensor Production Readiness Review
L2-5 Sensor PRR Module Testing Documentation

L1 module

1/27/2003 Noise L1 module with new SASEQ firmware (PRD2 after readout) and new grounding scheme : noise
12/9/2002 Laser stand and L1 module (Gustavo): .ppt

L2A 10-10 module #103 (HM sensors # 20,21)

5/6/2003 pedestal noise

L2A 10-10 module #106 (HM sensors # 113,114)

4/13/2004 0.6 uA @ 100V
4/13/2004 pedestal

L2A 10-10 module #7 (irradiated HM sensors ## 59 & 62)

3/17/2003 Shot noise A.Nomerotski
Noise at 70 V bias (I=2.8 mA, BW=4) Noise at 210 V bias (I=3.2 mA, BW=4)
Bias current vs. Temperature
Measured vs. calculated noise, bias 70 V, current 2.6 mA/module
Shot noise calculation for integrating preamp with double sampling (based on H.Spieler lectures)
2/24/2003 Noise at -9 degC, I = 170 uA @ 70 V, T = 132 nsec, BW = 4

L2A 20-20 module #8 (HM sensors # 29, 28, 33, 56) 1.2 MB photo 0.1 MB photo

2/19/2003 Combining AVDD and DVDD

2/17/2003 Readout through the full chain

2/17/2003 after PA_RST fix : A.Nomerotski Module testing
2/10/2003 new SASEQ firmware : PA_RST after 46 clocks

2/4/2003 L2A module testing

2/3/2003 Module Testing (Andrei Nomerotski) : .pdf
1/30/2003 L2A module : noise & pedestal

L2A 20-20 module #108 (HM sensors # 88, 131, 51, 48)

6/17/2003 has 9 working chips (chip 8 bypassed), 0.9 uA @ 70 V

noise & pedestal

L2S 10-10 module #1 (HM sensors # 57, 58) 1.2 MB photo 0.1 MB photo

3/4/2003 L2S module testing

noise DPS ON

2/4/2003 L2S module testing

L2S 10-10 module #6 (HM sensors # 116, 117)

4/13/2004 0.3 uA @ 100V
4/13/2004 pedestal

L2S 20-20 module #2 (HM sensors # 64, 63, 19, 65)

6/16/2003 has bad chips #1,2

L2S 20-20 module #12 (HM sensors # 108, 10, 8, 3)

6/27/2003 module has many rebonded channels for chips 6-10, current 2.0 uA @ 70V

pedestal noise

L2S 20-20 module #16 (HM sensors # 82, 83, 86, 90)

4/13/2004 0.4 uA @ 100V
4/13/2004 pedestal